Schweikert Research Group

Selected Publications

S. V. Verkhoturov, M. J. Eller, R. D. Rickman, S. Della-Negra and E. A. Schweikert, Single Impacts of C60 on Solids: Emission of Electrons, Ions and Prospects for Surface Mapping, J. Phys. Chem. C, 2010, 114 (12), 5637–5644 

V. T. Pinnick, S. V. Verkhoturov, L. Kaledin, Y. Bisrat and E. A. Schweikert, Molecular Identification of Individual Nano-Objects, Anal. Chem.,  2009, 81 (18), 7527–7531

S. Rajagopalachary, S. V. Verkhoturov and E. A. Schweikert, Characterization of Individual Ag Nanoparticles and Their Chemical Environment, Anal. Chem., 2009, 81 (3),  1089–1094

V. Pinnick, S. Rajagopalachary, S. V. Verkhoturov, L. Kaledin, E. A. Schweikert, Characterization of Individual Nano-Objects by Secondary Ion Mass Spectrometry, Analyt. Chem., 2008, 80, 9052-9057

C. Guillermier, S. Della Negra, E. A. Schweikert, A. Dunlop, G. Rizza, Emission of Molecular Fragments Synthesized in Hypervelocity Nanoparticle Impacts, Int. J. Mass Spectrom., 2008, 275, 86-90.

Rajagopalachary, S.; Verkhoturov, S.V.; Schweikert, E.A. Examination of Nanoparticles via Single Large Cluster Impacts Nano Letters, in Press, 2008.

Recent Publications

Coincidence Experiments in Desorption Mass Spectrometry, C. W. Diehnelt, R. D. English, M. J. Van Stipdonk, E. A. Schweikert, Nucl. Instr. Meth. Phys. Res., B193, 883-890 (2002).

A Novel Approach for Coincidence Ion Mass Spectrometry, S. V. Verkhoturov, E. A. Schweikert, Anal. Bioanal. Chem., 373, 609-611 (2002).

Surface Mass Spectrometry at the Submicrometer Scale, S. V. Verkhoturov, E. A. Schweikert, and N. M. Rizkalla, Langmuir, 18, 8836-8840 (2002).

Simultaneous Ejection of Two Molecular Ions from keV Gold Atomic and Polyatomic Projectile Impacts, R. D. Rickman, S. V. Verkhoturov, E. S. Parilis, E. A. Schweikert, Phys. Rev. Lett., 92, 047601-1-047601-4 (2004).

Nano-Domain Analysis via Coincidence Ion Mass Spectrometry, S. V. Verkhoturov, R. D. Rickman, S. Balderas, E. A. Schweikert, Appl. Surf. Sci., 231/232, 113-116 (2004).

Layer-by-Layer Characterization of Ultrathin Films with Secondary Ion Mass Spectrometry, Z. Li, R. D. Rickman, S. V. Verkhoturov, E. A. Schweikert, Appl. Surf. Sci., 231/232, 328-331 (2004).

Cluster Secondary Ion Mass Spectrometry: An Insight into  Super Efficient Collision Cascades, Richard D. Rickman, Stanislav V. Verkhoturov, Emile A. Schweikert, Appl. Surf. Sci., 231/232, 54-58 (2004).

Characterization of Surface Structure by Cluster Coincidental Ion Mass Spectrometry, R. D. Rickman, S. V. Verkhoturov, S. Balderas, N. Bestaoui, A. Clearfield, E. A. Schweikert, Appl. Surf. Sci., 231/232, 106-112  (2004).

Coincidental Emission of Molecular Ions from keV Carbon Cluster Impacts, J. E. Locklear, S. V. Verkhoturov, E. A. Schweikert, Int. J. Mass Spectrom., 238, 59-64 (2004).

Multiple Secondary Ion Emission from keV Massive Gold Impacts, R. D. Rickman, S. V. Verkhoturov, G. J. Hager, E. A. Schweikert, J. A. Bennett, Int. J. Mass Spectrom., 241, 57-61 (2005).

Multi-ion Emission from Large and Massive keV Cluster Impacts, R. D. Rickman, S. V. Verkhoturov, G. J. Hager, E. A. Schweikert, Int. J. Mass Spectrom., 245, 48-52 (2005).

Influence of Massive Projectile Size and Energy on Secondary Ion Yields from Organic Surfaces, C. Guillermier, S. Della Negra, R. D. Rickman, V. Pinnick, E. A. Schweikert, Appl. Surf. Sci., 252, 6529-6532 (2006).

Organic SIMS with Single Massive Gold Projectiles:  Ion Yield Enhancement by Silver Metallization, C. Guillermier, V. Pinnick, S. V. Verkhoturov, E. A. Schweikert, Appl. Surf. Sci., 252, 6644-6647 (2006).

Molecular Ion Emission from Single Large Cluster Impacts, S. V. Verkhoturov, R. D. Rickman, C. Guillermier, G. J. Hager, J. E. Locklear, E. A. Schweikert, Appl. Surf. Sci., 252, 6490-6493 (2006).

Au-Analyte Adducts Resulting from Single Massive Gold Cluster Impacts, G. J. Hager, C. Guillermier, S. V. Verkhoturov, E. A. Schweikert, Appl. Surf. Sci., 252, 6558-6561 (2006).

Matrix-Enhanced Cluster-SIMS, J. E. Locklear, C. Guillermier, S. V. Verkhoturov, E. A. Schweikert, Appl. Surf. Sci., 252, 6624-6627 (2006).

Nanovolume Analysis with SIMS Using Massive Projectiles, Z. Li, S. V. Verkhoturov, E. A. Schweikert, Analyt. Chem., 78, 7410-7416 (2006).

Prompt in situ Emission of Gold Adducts from Single Impacts of Large Gold Clusters on Organics Solids, C. Guillermier, S. Della Negra, R. Rickman, G.J. Hager, E.A. Schweikert, Int. J. Mass Spectrom., 263, 298-303 (2007).

SIMS with C60+ and Au4004+ Projectiles: Depth and Nature of Secondary Ion Emission from Multilayer Assemblies, Z. Li, S.V. Verkhoturov, J.E. Locklear, E.A. Schweikert, Int. J. Mass Spectrom., 269, 112-117 (2008).

Examination of Nanoparticles via Single Large Cluster Impacts, S. Rajagopalachary, S.V. Verkhoturov, E.A. Schweikert, Nano Letters, 8 (4), 1076 1080 (2008).

Emission of Molecular Fragments Synthesized in Hypervelocity Nanoparticle Impacts, C. Guillermier, S. Della Negra, E. A. Schweikert, A. Dunlop, G. Rizza, Int. J. Mass Spectrom., 275, 86-90 (2008).

Characterization of Individual Nano-Objects by Secondary Ion Mass Spectrometry, V. Pinnick, S. Rajagopalachary, S. V. Verkhoturov, L. Kaledin, E. A. Schweikert, Analyt. Chem., 80, 9052-9057 (2008).

Characterization of Individual Ag Nanoparticles and Their Chemical Environment, S. Rajagopalachary, S. V. Verkhoturov and E. A. Schweikert, Anal. Chem., 81 (3),  1089 1094, (2009)

Molecular Identification of Individual Nano-ObjectsV. T. Pinnick, S. V. Verkhoturov, L. Kaledin, Y. Bisrat and E. A. Schweikert, Anal. Chem., 81 (18), 7527-7531 (2009)

Single Impacts of C60 on Solids: Emission of Electrons, Ions and Prospects for Surface Mapping, S. V. Verkhoturov, M. J. Eller, R. D. Rickman, S. Della-Negra and E. A. Schweikert, J. Phys. Chem. C, 114 (12), 5637-5644  (2010)

Real-time localization of single C60 impacts with correlated secondary ion detection, M. J. Eller, S. V. Verkhoturov, S. Della-Negra, R. D. Rickman and E. A. Schweikert, Surface and Interface Analysis, In Press (2010)

Statistics of electron and ion emission from single massive cluster impacts, S. V. Verkhoturov, M. J. Eller, S. Della-Negra, R. D. Rickman, J. E. Locklear and E. A. Schweikert, Surface and Interface Analysis, In Press (2010)

Photon emission from massive projectile impacts on solids, F. A. Fernandez-Lima, V. T. Pinnick, S. Della-Negra and E. A. Schweikert, Surface and Interface Analysis, In Press (2010)

Probing chemical homogeneity within single cluster impact sites, V. Pinnick, S.V. Verkhoturov, L. Kaledin and E. A. Schweikert, Surface and Interface Analysis, In Press (2010)

Characterization and quantification of biological micropatterns using cluster SIMS, L.J. Chen, S. S. Shah, S. V. Verkhoturov, A. Revzin and E. A. Schweikert, Surface and Interface Analysis, In Press (2010)

Examination of individual nanoparticles with cluster SIMS, S. Rajagopalachary, S. V. Verkhoturov and E. A. Schweikert, Surface and Interface Analysis, In Press (2010)

Electron Emission from Hypervelocity C60 Impacts, M. J. Eller, S. V. Verkhoturov, S. Della-Negra and E. A. Schweikert J. Phys. Chem. C, Articles ASAP (2010)