Schweikert Research Group

Selected Publications

S. V. Verkhoturov, M. J. Eller, R. D. Rickman, S. Della-Negra and E. A. Schweikert, Single Impacts of C60 on Solids: Emission of Electrons, Ions and Prospects for Surface Mapping, J. Phys. Chem. C, 2010, 114 (12), 5637–5644 

V. T. Pinnick, S. V. Verkhoturov, L. Kaledin, Y. Bisrat and E. A. Schweikert, Molecular Identification of Individual Nano-Objects, Anal. Chem.,  2009, 81 (18), 7527–7531

S. Rajagopalachary, S. V. Verkhoturov and E. A. Schweikert, Characterization of Individual Ag Nanoparticles and Their Chemical Environment, Anal. Chem., 2009, 81 (3),  1089–1094

V. Pinnick, S. Rajagopalachary, S. V. Verkhoturov, L. Kaledin, E. A. Schweikert, Characterization of Individual Nano-Objects by Secondary Ion Mass Spectrometry, Analyt. Chem., 2008, 80, 9052-9057

C. Guillermier, S. Della Negra, E. A. Schweikert, A. Dunlop, G. Rizza, Emission of Molecular Fragments Synthesized in Hypervelocity Nanoparticle Impacts, Int. J. Mass Spectrom., 2008, 275, 86-90.

Rajagopalachary, S.; Verkhoturov, S.V.; Schweikert, E.A. Examination of Nanoparticles via Single Large Cluster Impacts Nano Letters, in Press, 2008.

 

Instrumentation

Schematic of the Imaging SIMS. Module I, contains the primary ion source (currently C60, to be replaced with Au- and Bi-LMIS), mass filter (to be upgraded), acceleration stage (currently 15 kV, to be replaced with 200 kV set-up), primary ion optics and pulsing for achieving the conditions of single projectile bombardment. Module II, consist of the sample stage, an immersion objective (L1, Slodzian type) and a magnetic prism with achromatic deflection (Liebl type). Module III, contains the electron optics and electron imaging detector. The optics (L2-L4) are those of an emission electron microscope, calculated to minimize spherical and chromatic aberrations. The electron imaging detector consists of a dual MCP, a phosphor screen attached to a fiber optic rod (Beam Imaging Solution Inc.) and a CMOS camera (Basler A504k). Module IV, corresponds to the SI ToF region with a 8- or 16- anode detector.  Module V (planned, hence the dotted lines), is composed of the VUV laser with optics for the postionization experiments.