In order to use the equipment in the MCF, users must be checked out on the instrument they wish to use. There are two ways to get checked out on an instrument, demonstrate prior knowledge of the instrument or take a training class provided by MCF staff. Our training classes are carried out in a 1-to-1 environment

Training Request Form

XPS Training
Users wishing to use the Kratos Imaging XPS system will be trained in a stepwise fashion. There will be three levels of instruction (beginning, intermediate, and advanced). Users will take the classes in order in order of increasing capabilities, however most users will find the beginning classes sufficient for their research needs.

Beginning Class: The beginning class will be spread over two sessions after which the user should be able to carry out basic XPS analysis of samples. The first session will involve an introduction to the physics of XPS, vacuum operation and safety. The user will be taught how to obtain survey spectra, carry out individual element detection on conductive samples, and conduct off-line data processing. The first of the two sessions will involve analysis of a standard sample (e.g. Ag foil), while the student may bring one his/her own samples for the second session, when he/she will run the instrument under direct supervision.

Intermediate Class(one session): XPS imaging and elemental mapping, charge neutralization for insulating samples, intermediate data processing

Advanced Class(one session): angle-resolved XPS, small spot spectroscopy, and automatic instrument operation.

Each session will be approximately 4 hrs long.

AFM/STM Training
Users wishing to use the Digital Instruments AFM/STM will be trained on the basic operation of scanning probe microscopy, atomic force microscopy (AFM) and/or scanning tunneling microscopy (STM) depending on the individual requirements. The checkout will consist of a 4 hour session after which the user should be proficient in the basic operation of the instrument. Additional sessions will be required for more advanced techniques.

Cleanroom Training
In order to be checked out on the equipment in the MCF cleanroom (mask aligner, metal evaporation chamber, spin coater, reactive ion etcher, profilometer, wire bonder, 3-D microscope, dicing saw) one should contact MCF staff. Training for cleanroom instrumentation is tailored to fit the specific needs of the researcher. The length of the training session depends on the instrument but one can approximately figure on one-two hours per instrument.

Nanoindenter training
To gain access to the Hysitron nanoindenter, one should first be familiar with scanning probe microscopy (especially AFM) because the nanoindenter is an advanced SPM instrument. Once a prior SPM background is established, training on the nanoindenter will begin. This training is scheduled as necessary and takes two half-day sessions. Please contact MCF staff for more information on training for this instrument.

Confocal Training
To gain access to either of the Leica confocal instruements, the user must complete a 3 hr training requirement (1 or 2 sessions). This training includes a basic description of the microscope and the controls, startup/shutdown procedures, visually checking fluorescence of a Leica standard sample using the mercury lamp and basic operation of the confocal software – beam settings, image optimization, and Z-stack acquisition. After using the Leica standard sample for demonstration purposes, a sample of the students can be examined.

Raman Training
To gain access to the Jobin Yvon LabRam microscope, the user must complete a 4 hr training requirement (2 sessions). The first session will involve an introduction to the instrument including the optics (for switching lasers), followed by acquisition of a raman spectrum of pure Si and a demonstration of the effects of changing the parameters (laser line, grating, neutral density filters, acquisiton time). The second session will involve collecting a raman spectrum of either (a) a sample provided by the student or (b) a standard SWNT sample. For this session, the student will operate the instruemnt under direct supervision.

FTIR Training
To gain access to the Jobin Yvon LabRam microscope, the user must complete a 2 hr training requirement (1 session). The training will involve an introduction to the instrument and the different kinds of FTIR analysis possible. We will obtain a spectrum of a polyethylene standard and then look at a sample provided by the student.

Training Guidelines for the MCF (effective 09/01/06)

The following prices are for individual training sessions.

• The number of hours of training required may vary from student-to-student, and prices will be adjusted accordingly.

User Fee breakdown

More information on the training classes, scheduling training, and customized classes can be obtained by contacting Dr. Gang Liang, manager of the MCF.