Kratos Axis Ultra Imaging Click for XPS instructions We currently have a Kratos Axis Ultra Imaging X-ray photoelectron spectrometer (XPS or ESCA for electron spectroscopy for chemical analysis). XPS is a powerful technique for the elemental surface detection of variations in chemical composition and oxidation state. Subtle changes in peak positions and shape can yield important information on changes in surface chemistry. AXIS Ultra provides a high energy resolution capability for both conductive and insulating samples through a Kratos patented charge neutralisation system. Fast Parallel Imaging The incorporation of the patented spherical mirror analyzer in conjunction with the standard hemispherical system in the AXIS Ultra provides the ability to obtain not only high spatial resolution imaging, but also a real-time parallel detection facility that allows high quality chemical images to be obtained in only a few seconds. Small Area Spectroscopic Analysis A key feature of an XPS instrument is the ability to obtain spectroscopic information from a selected area of a sample without the need to translate the specimen. The ability to obtain a fast parallel chemical image which can be used as a reference to perform spectroscopic analysis is an integral part of the AXIS Ultra system. The incorporated electrostatic deflection system allows easy multi-point analysis to be carried out from within the imaged field of view. |
For training on this instrument, please contact Gang Liang |
