Raman



Click for Raman instructions

The MCF has recently acquired an integrated Raman/FTIR /AFM/NSOM system with nanoscale spatial resolution for materials research. The JY Horiba LabRam IR system combines in a single benchtop system, both confocal raman microscopy and complementary FTIR micro-spectroscopy. The instrument provides highly specific spectral fingerprints which enables precise chemical and molecular characterization and identification. It offers the advantage of same spot analysis where the same position on the sample can be analyzed via both techniques without the need for any sample positioning or instrument adjustment. The raman microscope is based around the established high performance of the LabRam series of Raman microscopes, offering optimal confocal spatial and depth discrimination down to 1 μm, multiple laser options and automated XYZ mapping. The FTIR module is hard-coupled to the base unit and provides fast FTIR micro-analysis with both contact (ATR) and non-contact (ARO) IR optimized objectives. Integration of the module enables quick and easy selection of the required spectroscopic mode. For more information please see: JY Horiba Raman Division and Nanonics

  • Microscope
Olympus BX 41 microscope. The computer-controlled motorized XYZ microscope stage, step size 0.1 μm, serves both the Raman and FTIR modules and will accommodate the NSOM head.
  • Raman module
The Raman module consists of a stigmatic 800 nm spectrograph with two confocal spectrometer entrances, one connected to the microscope, the other via a fibre optics coupler, and 632nm and 785nm laser excitation lines. The spectrometer is equipped with two detectors. Spectral Range: 400 nm – near-Infrared (NIR); Raman Shift: 100-6000 cm -1 (blue/green excitation); Spectral Resolution: Depends on excitation frequency and grating used; Resolution = 0.3cm -1 /pixel at 680nm excitation with 1800 gr/mm and 1024 detector; Imaging Resolution: diffraction limited, ~ 1 μm at 633 nm, objective 100X. Detectors: (1) JY open electrode CCD with enhanced quantum efficiency in the spectral range 450 – 950 nm; (2) InGaAs diode array JY IGA-3000, with highest sensitivity between 900 nm and 1700 nm.
  • IR module
The IR module is a Michelson Interferometer equipped with an MCT detector that functions as an FTIR spectrometer. Spectral Range: 650-4000 cm -1 (absolute wave numbers); Spectral Resolution: 4cm -1; Imaging Resolution (FTIR Microscope): Contact and/or non-contact modes with 10-40 μm discrimination. All IR objectives are mounted on the micrscope nosepiece. Infrared Reflecting Objective: used for viewing samples and collecting IR spectra. Contact IR ATR Objective: provides ultimate ease-of-use for mid-IR spectroscopy and microscopy. Measure samples simply by making contact. Contact area 20-50 μm.
  • NSOM/SPM-100 module
NSOM/SPM-100 San Head Assembly (performs NSOM and AFM) driven by Nanonics TOPAZ controller; Normal force module with Quad Position Sensitive Detector. Scan Range: Lateral (xy) and axial (z) – 50 μm at steps < 1nm; NSOM/AFM tip mounts for contact, non-contact and intermittant contact mode NSOM; Cantilevered fiber near-field imaging probes. Imaging Resolution: NSOM: 50 nm and upwards, depending on the aperture size of the NSOM probe used; AFM - <1 nm (Z), (xy) depenent on the radius of the tip used. Optical illumination and detection system (APD) for performing standard NSOM imaging is included. A cantilever fiber probe is used for NSOM Raman /fluorescence imaging. The module supports various imaging modes NSOM, AFM (contact and non-contact), phase, LFM, error signal and STM. Please Note: Special Acknowledgement requirement for the new Raman/FTIR/AFM/NSOM: NSF guidelines mandate that the use of the funded Horiba Jobin Yvon/Nanonics Raman/FTIR/ AFM/NSOM must be properly acknowledged in any publications (including web pages): “The Raman/FTIR/AFM/NSOM acquisition was supported by the National Science Foundation under Grant No. BES-0421409”. Users are also required to file a copy of any relevant publication containing the acknowledgement with the MCF Adminstrative Office (maser@tamu.edu).

For training on this instrument, please contact Orla Wilson